Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset

Ryusuke Sagawa; Hao Yang; Lewys Jones; Martin Simson; Martin Huth; Heike Soltau; Peter D. Nellist; Yukihito Kondo

doi:10.1017/s1431927617000940

journal article·2017-07Open access

Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset

Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter D. Nellist, Yukihito Kondo

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter D Nellist, Yukihito Kondo; Development of Fast Pixelated STEM Detect

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis

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References (9)

Show source-provided references

1. 10.1111/jmi.1237210.1111/jmi.12372 ↗

2. 10.1016/j.ultramic.2016.03.00610.1016/j.ultramic.2016.03.006 ↗

3. 10.1016/j.ultramic.2014.09.01310.1016/j.ultramic.2014.09.013 ↗

4. 10.1088/1748-0221/11/04/P0400610.1088/1748-0221/11/04/P04006 ↗

5. 10.1038/374630a010.1038/374630a0 ↗

6. 10.1017/S143192760909389110.1017/S1431927609093891 ↗

7. 10.1038/ncomms1253210.1038/ncomms12532 ↗

8. 10.1093/jmicro/dfq01410.1093/jmicro/dfq014 ↗

9. 10.1017/S143192761501566410.1017/S1431927615015664 ↗