Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy

Y. Chen; K.P. Rice; T.J. Prosa; E.A. Marquis; R.C. Reed

doi:10.1017/s1431927615004237

journal article·2015-08Open access

Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy

Y. Chen, K.P. Rice, T.J. Prosa, E.A. Marquis, R.C. Reed

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

Y Chen, KP Rice, TJ Prosa, EA Marquis, RC Reed; Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy, Micros

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: High-Temperature Coating Behaviors · High Temperature Alloys and Creep · Metallurgical Processes and Thermodynamics

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References (3)

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1. 10.1016/j.ultramic.2014.04.00310.1016/j.ultramic.2014.04.003 ↗

2. 10.1016/S0079-6425(00)00020-710.1016/S0079-6425(00)00020-7 ↗

3. 10.1007/s11085-014-9502-710.1007/s11085-014-9502-7 ↗