journal article·2012-07

Understanding Structural Defects in Lithium-rich Layered Oxide Cathodes by Aberration-Corrected STEM

K. Jarvis, Z. Deng, A. Manthiram, P.J. Ferreira, L.F. Allard

Microscopy and Microanalysis· Volume 18· Issue S2
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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References

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