Symposium on Ultrafast Electron Microscopy and Ultrafast Science

Dynamic characterization techniques have been utilized in the fields of biology, chemistry, physics, and materials science for many years. Techniques range from neutron scattering to X-ray diffraction. Two of the fields experiencing much development recently have been electron-based techniques. Namely, ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) have been advancing rapidly, but unfortunately, in parallel. We are approaching an era where the convergence of these two techniques could open up a wide range of scientific and technological opportunities and advancements.