Gallium Phase Formation in Cu and Other FCC Metals During Near-Normal Incidence Ga-FIB Milling and Techniques to Avoid this Phenomenon
Source abstract
Abstract
MW Phaneuf, J Li, JD Casey, Jr.; Gallium Phase Formation in Cu and Other FCC Metals During Near-Normal Incidence Ga-FIB Milling and Techniques to Avoid thi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
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