journal article·2026-05-12Open access

Using a 4-Megapixel Hybrid Photon Counting Detector for Fast, Laboratory-Based Nanoscale X-Ray Tomography

Jordan Fonseca, Zachary H Levine, Joseph W Fowler, Felix H Kim, Galen O’Neil, Nathan J Ortiz, John Henry Scott, Daniel S Swetz, Paul Szypryt, Andras E Vladar, Nathan Nakamura

Microscopy and Microanalysis· Volume 32· Issue 3

Abstract

Abstract Hybrid photon counting detectors (HPCDs) have unlocked new capabilities for X-ray-based measurements at synchrotrons around the world in the last 30 years. By leveraging independently optimized sensor and readout layers, they offer high quantum efficiency (>80 %), ultra-low dark counts, sub-pixel point-spread function, and high count rates (>106 counts per pixel per second). Furthermore, their small pixel size and large active area endow them with excellent coverage and resolution for both real-space and reciprocal space imaging. Here, we demonstrate that HPCDs are also well-suited for laboratory-based nanoscale X-ray tomography (nano-xCT). We perform nano-xCT on an integrated circuit fabricated at the 130-nm node and produce a 3D reconstruction with over 40 times more photons collected more than 20 times faster than in this group’s previous work, for an overall speedup of over 800×. We review the technical considerations of using an HPCD for tabletop tomography. We quantify our reconstruction image quality using well-established metrics, including the modulation transfer function (MTF), Fourier shell correlation (FSC), and contrast-to-noise (CNR), to validate our choice of experimental parameters that provide sufficient resolution and imaging speed. We determine that under current experimental conditions, 160-nm wiring features are reconstructed at 75–80 nm spatial resolution.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced X-ray and CT Imaging · Advanced X-ray Imaging Techniques · Particle Detector Development and Performance

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Quantum Sensors Division, National Institute of Standards and Technology , 325 Broadway, Boulder, CO 80305 ,

Quantum Measurement Division, National Institute of Standards and Technology , 100 Bureau Dr, Gaithersburg, MD 20899 ,

Intelligent Systems Division, National Institute of Standards and Technology , 100 Bureau Dr, Gaithersburg, MD 20899 ,

Materials Measurement Science Division, National Institute of Standards and Technology , 100 Bureau Dr, Gaithersburg, MD 20899 ,

Department of Physics, University of Colorado Boulder , 2000 Colorado Ave, Boulder, CO 80309 ,

Microsystems and Nanotechnology Division, National Institute of Standards and Technology , 100 Bureau Dr, Gaithersburg, MD 20899 ,

Funding

CHIPS Metrology Program · National Institute of Standards · Technology, U.S. Department of Commerce

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