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2. Retrieval of the projected potential by inversion from the scattering matrix in electron–crystal scattering
10.1107/S0108767398003705 ↗6. Brown · 2024
8. A three-dimensional reconstruction algorithm for scanning transmission electron microscopy data from a single sample orientation
10.1017/S1431927622012090 ↗11. Surface determination through atomically resolved secondary-electron imaging
10.1038/ncomms8358 ↗13. Simultaneous sample and spatial coherence characterization using diffractive imaging
10.1063/1.3650265 ↗15. Inversion of many-beam Bragg intensities for phasing by iterated projections: Removal of multiple scattering artifacts from diffraction data
10.1103/PhysRevLett.125.065502 ↗17. Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
10.1063/1.4711766 ↗19. Scattering matrix determination in crystalline materials from 4D scanning transmission electron microscopy at a single defocus value
10.1017/S1431927621000490 ↗21. Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science
10.1063/5.0101895 ↗34. Lattice strain measurement of core@shell electrocatalysts with 4D scanning transmission electron microscopy nanobeam electron diffraction
10.1021/acscatal.0c00224 ↗35. Disentangling multiple scattering with deep learning: Application to strain mapping from electron diffraction patterns
10.1038/s41524-022-00939-9 ↗36. Quantitative convergent-beam electron diffraction and quantum crystallography—the metallic bond in aluminium
10.1007/s11224-017-0984-1 ↗39. Optimising structure factors from four-dimensional scanning transmission electron microscopy via the scattering matrix
10.1093/mam/ozaf111 ↗40. Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond
10.1017/S1431927619000497 ↗41. Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions
10.1016/j.ultramic.2015.12.002 ↗42. Advanced phase reconstruction methods enabled by four-dimensional scanning transmission electron microscopy
10.1017/S1431927619000783 ↗45. Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network
10.1103/PhysRevB.89.205409 ↗47. Uncovering the three-dimensional structure of upconverting core–shell nanoparticles with multislice electron ptychography
10.1063/5.0206814 ↗49. Determining the projected crystal structure from four-dimensional scanning transmission electron microscopy via the scattering matrix
10.1093/micmic/ozad018 ↗50. py4DSTEM: A software package for four-dimensional scanning transmission electron microscopy data analysis
10.1017/S1431927621000477 ↗51. Improved three-dimensional reconstructions in electron ptychography through defocus series measurements
10.1093/mam/ozae110 ↗52. Deep sub-angstrom resolution imaging by electron ptychography with misorientation correction
10.1126/sciadv.abn2275 ↗54. Practical considerations for using K3 cameras in CDS mode for high-resolution and high-throughput single particle cryo-EM
10.1016/j.jsb.2021.107745 ↗55. Resolution of virtual depth sectioning from four-dimensional scanning transmission electron microscopy
10.1093/micmic/ozad068 ↗59. General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM
10.1103/PhysRevB.87.184108 ↗64. Insights into chemical and structural order at planar defects in Pb2MgWO6 using multislice electron ptychography
10.1021/acsnano.4c14833 ↗