Unraveling the Mechanism of Phase Segregation Phenomena in IGZO Compounds via Precession Electron Diffraction and In-Situ TEM

journal article·2025-07-25

Marta Agati, Pradyumna K Parida, Harold Dekkers, Athanassios S Galanis, Olivier Richard, Eva Grieten, Paola Favia

Microscopy and Microanalysis· Volume 31· Issue Supplement_1

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OpenAlex topics: Thin-Film Transistor Technologies · ZnO doping and properties · Semiconductor materials and interfaces

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Imec , Leuven ,

NanoMegas , Brussels ,

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4. Alet · J. Mater. Chem. · 2008 · 18 · 518710.1039/B813046A ↗