Surface Atomic Defects and Self-Regulated CO Adsorption on Cu(111): Insights from High-Resolution Scanning Probe Microscopy

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques

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Affiliations

Princeton Materials Institute, Princeton University , Princeton, NJ ,

Department of Operations Research and Financial Engineering, Princeton University , Princeton, NJ ,

References (8)