journal article·2025-07-25

Characterization of CdTe Back-Contacts with Thick Alumina Reflectors

Etee Kawna Roy, Ashraful Mamun, Heayoung Yoon

Microscopy and Microanalysis· Volume 31· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Semiconductor Quantum Structures and Devices · Advanced Semiconductor Detectors and Materials

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Affiliations

Department of Electrical and Computer Engineering, University of Utah , Salt Lake City, Utah ,

References (6)

Show source-provided references
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4. Roy · Adv Materials Inter · 2024 · 11 · 240050110.1002/admi.202400501 ↗
5. Reese · Journal of Applied Physics · 2015 · 118 · 15530510.1063/1.4933186 ↗
6. Magginetti · Adv Materials Inter · 2019 · 610.1002/admi.201900300 ↗