Emerging Modalities for Condensed Matter Explorations Using Ultrafast Electron Microscopy
Bibliographic record
Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications · Near-Field Optical Microscopy
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Affiliations
Faculty of Electrical & Computer Engineering, Technion - Israel Institute of Technology , Haifa , Israel
References (14)
Show source-provided references
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