journal article·2024-07-24Open access

Electron Correlation Microscopy: In Situ 4D STEM for Fluctuating Systems

Shuoyuan Huang, Carter Francis, Paul M Voyles

Microscopy and Microanalysis· Volume 30· Issue Supplement_1

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications · Spectroscopy and Quantum Chemical Studies

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Affiliations

Department of Materials Science and Engineering, University of Wisconsin-Madison , Madison, WI , United States

References (4)

Show source-provided references
1. He · Microsc. Microanal · 2015 · 21 · 102610.1017/S1431927615000641 ↗
2. Zhang · Nat. Commun · 2018 · 9 · 112910.1038/s41467-018-03604-2 ↗
3. Spangenberg · Adv. Funct. Mater · 2021 · 31 · 20210374210.1002/adfm.202103742 ↗
4. Huang · Ultramicroscopy · 2024 · 256 · 11388610.1016/j.ultramic.2023.113886 ↗