journal article·2024-07-24

Correlative XPS Analysis of a Novel Material System Generated Using a Combinatorial Approach

Jonathan D P Counsell, Naila M Al Hasan, David Surman, Christopher Moffitt, Tieren Gao, Huilong Hou, Ichiro Takeuchi

Microscopy and Microanalysis· Volume 30· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science

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Affiliations

Kratos Analytical Limited , Manchester , UK

Department of Materials Science and Engineering, University of Maryland , Maryland , USA

Kratos Analytical Inc , New York , USA

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