Deep Learning Object Detection Video Analysis to Determine Grain Boundary Defect Sink Efficacy in Ion Irradiated Specimens
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Abstract
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Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Industrial Vision Systems and Defect Detection · Silicon and Solar Cell Technologies
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Affiliations
Johns Hopkins University, Department of Materials Science and Engineering , Baltimore, MD , USA
References (4)
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1. Jacobs · Comp. Mat. Sci · 2022 · 211 · 11152710.1016/j.commatsci.2022.111527 ↗
2. Shen · Comp. Mat. Sci. · 2021 · 197 · 11056010.1016/j.commatsci.2021.110560 ↗
3. Sainju · Sci. Rep · 2022 · 12 · 1570510.1038/s41598-022-19697-1 ↗
4. Nathaniel · Acta Mater · 2022 · 226 · 11762410.1016/j.actamat.2022.117624 ↗