journal article·2022-08-01Open access

In-situ Fracture Toughness of Single Crystal Silicon Double-Cantilever Beams

Sara M Dickens, Frank W DelRio, Scott J Grutzik, William M Mook, Brad L Boyce, Eric Hintsala, Douglas Stauffer, Robert F Cook

Microscopy and Microanalysis· Volume 28· Issue S1

Abstract

Sara M Dickens, Frank W DelRio, Scott J Grutzik, William M Mook, Brad L Boyce, Eric Hintsala, Douglas Stauffer, Robert F Cook; In-situ Fracture Toughness o
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Surface Polishing Techniques · Nanowire Synthesis and Applications · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Sandia National Laboratories , Albuquerque, NM, USA

Bruker Nano Surfaces , Eden Prairie, MN, USA

Independent Scientist , Winterville, NC, USA

References (2)

Show source-provided references
1. Jaya · J. Mater. Res · 2015 · 30 · 68610.1557/jmr.2015.2 ↗
2. Hintsala · Scr. Mater · 2017 · 130 · 7810.1016/j.scriptamat.2016.11.016 ↗