Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI
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Abstract
Joseph Tessmer, Marc De Graef; Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI, Microscopy and Microanalysis, Volume 27, Issue S1, 1 August
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced Electron Microscopy Techniques and Applications
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References (4)
Show source-provided references
1. Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm10.1002/sia.5175 ↗
2. A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns10.1016/j.ultramic.2019.112841 ↗
3. Dynamical electron backscatter diffraction patterns. Part I: Pattern simulations.10.1017/S1431927613001840 ↗
4. [4] The authors acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785.