Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO₃ Capacitors with STEM EBIC

William Hubbard; Zachary Lingley; Miles Brodie; Brendan Foran

doi:10.1017/s1431927620014427

journal article·2020-08Open access

Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO₃ Capacitors with STEM EBIC

William Hubbard, Zachary Lingley, Miles Brodie, Brendan Foran

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

William Hubbard, Zachary Lingley, Miles Brodie, Brendan Foran; Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO3 Capacitors wi

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Ferroelectric and Piezoelectric Materials

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