Precise Measurements of Transmission Attenuation in Mass-Thickness Contrast TEM Images

Journal Article Precise Measurements of Transmission Attenuation in Mass-Thickness Contrast TEM Images Get access Jun Yamasaki, Jun Yamasaki Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, JapanInstitute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan Corresponding author: yamasaki@uhvem.osaka-u.ac.jp Search for other works by this author on: Oxford Academic Google Scholar Yuya Ubata, Yuya Ubata Department of Electronic Engineering, Osaka University, Suita, Japan Search for other works by this author on: Oxford Academic Google Scholar Hidehiro Yasuda Hidehiro Yasuda Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, JapanDivision of Materials and Manufacturing Science, Osaka University, Suita, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2418–2419, https://doi.org/10.1017/S1431927619012820 Published: 01 August 2019