DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

Methods for Simulation of Electron Energy Loss Spectra for Low Energy Edges in Battery Materials

Quentin Stoyel, Frederic Voisard, Nicolas Brodusch, George Demopoulos, Raynald Gauvin

Microscopy and Microanalysis· Volume 24· Issue S1
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Abstract

Quentin Stoyel, Frederic Voisard, Nicolas Brodusch, George Demopoulos, Raynald Gauvin; Methods for Simulation of Electron Energy Loss Spectra for Low Energ
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Energy storage

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Battery Materials · Semiconductor materials and devices

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References (4)

Show source-provided references
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2. 10.1103/PhysRevB.77.04511710.1103/PhysRevB.77.045117 ↗
3. 10.1016/j.micron.2006.03.01010.1016/j.micron.2006.03.010 ↗
4. 10.1103/PhysRevB.74.11510610.1103/PhysRevB.74.115106 ↗