A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
Source abstract
Abstract
Lan-Hsuan Lee, Chia-Hao Yu, Yu-Ting Hong, Cheng-Yen Wen; A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (7)
Show source-provided references
1. 10.1016/j.micron.2014.04.01110.1016/j.micron.2014.04.011 ↗
2. 10.1557/mrs2007.6310.1557/mrs2007.63 ↗
3. 10.1116/1.137131710.1116/1.1371317 ↗
4. 10.1017/S143192760999036510.1017/S1431927609990365 ↗
5. The authors acknowledge funding from the Ministry of Science and Technology of Taiwan, Grant No. MOST 103-2112-M-002-015-MY3..
6. 10.1016/j.micron.2013.10.00710.1016/j.micron.2013.10.007 ↗
7. 10.9729/AM.2015.45.4.19510.9729/AM.2015.45.4.195 ↗