The Perfect Cut: Focused Ion Beam Preparation for In Situ TEM
Source abstract
Abstract
Andrew Lang, Wayne Harlow, Michael Jablonski, James Hart, Christopher Barr, Hessam Ghassemi, Osman El-Atwani, Mitra L Taheri; The Perfect Cut: Focused Ion
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/j.micron.2012.02.00910.1016/j.micron.2012.02.009 ↗
2. Nano Letters 14.6 · 2014 · 3617
3. 10.1063/1.481845010.1063/1.4818450 ↗
4. 10.1063/1.474608210.1063/1.4746082 ↗