A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

Journal Article A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications Get access Philipp Brüner, Philipp Brüner ION-TOF GmbH, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Thomas Grehl, Thomas Grehl ION-TOF GmbH, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Hidde H Brongersma, Hidde H Brongersma ION-TOF GmbH, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Ewald Niehuis Ewald Niehuis ION-TOF GmbH, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 358–359, https://doi.org/10.1017/S1431927616002646 Published: 25 July 2016