A Simple and Accurate Approach for Thickness Measurement of Particles and Thin Films Using SEM-EDS
Source abstract
Abstract
International audience
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Battery Materials · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Univ Paris Est Creteil and Université Paris Cité, UMR CNRS 7583, Laboratoire Interuniversitaire des Systèmes Atmosphériques , Paris , France
References (14)
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