Towards Atomic-Resolution Electron Energy Loss Spectroscopy in an Uncorrected 30kV Scanning Electron Microscope
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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Affiliations
SuperSTEM Laboratory, SciTech Daresbury Campus , Daresbury , United Kingdom
School of Chemical and Process Engineering & School of Physics and Astronomy, University of Leeds , Leeds , United Kingdom
School of Physics, Engineering and Technology, University of York , York , United Kingdom
Hitachi High-Technologies Corp., Application Development Department , Ibaraki , Japan
Hitachi High-Technologies Corp., Electron Microscope Systems Design 1st Dept., Ibaraki , Japan
Hitachi High-Tech Europe, SciTech Daresbury Campus , Daresbury , United Kingdom
School of Materials, University of Manchester , Manchester , United Kingdom