journal article·2024-07-24

High-Resolution Imaging and X-Ray Microanalysis of Oxide at Low Energy using Scanning Electron Microscope and Triple Beam FIB Microscope

Ritvij Chandrakar, Stéphanie Bessette, Nicolas Brodush, Raynald Gauvin

Microscopy and Microanalysis· Volume 30· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: High-Temperature Coating Behaviors · Nuclear Materials and Properties · Electron and X-Ray Spectroscopy Techniques

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Affiliations

McGill Electron Microscopy Research Group, Department of Mining and Materials Engineering, McGill University , Montreal, Quebec , Canada

References (5)

Show source-provided references
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2. Bastin
3. Bastin · X-Ray Spectrometry · 1986 · 15
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