A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography
Source abstract
Abstract
Karen DeRocher, Mark McLean, Fred Meisenkothen; A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography, Microscopy and Microanalys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
National Institute of Standards and Technology , Gaithersburg, Maryland, United States
References (10)
Show source-provided references
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