Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope
Source abstract
Abstract
Y Zheng, R E A Williams, H L Fraser; Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications
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References (2)
Show source-provided references
1. 10.1016/j.actamat.2012.04.01910.1016/j.actamat.2012.04.019 ↗
2. 10.1016/j.actamat.2012.07.03310.1016/j.actamat.2012.07.033 ↗