Advances in EBSD sample preparation by broad ion beam milling
Source abstract
Abstract
Laurie Palasse, Pawel Nowakowski; Advances in EBSD sample preparation by broad ion beam milling, Microscopy and Microanalysis, Volume 27, Issue S1, 1 Augus
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (8)
Show source-provided references
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5. Reducing focused ion beam damage to transmission electron microscopy samples10.1093/jmicro/dfh080 ↗
6. TEM sample preparation and FIB-induced damage10.1557/mrs2007.63 ↗
7. Effects of focused ion beam Milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia10.1111/j.1365-2818.2012.03616.x ↗
8. Sample preparation using broad argon ion beam Milling for electron backscatter diffraction (EBSD) analysis10.1017/S143192761600091X ↗