Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry

Menglin Zhu; Jinwoo Hwang

doi:10.1017/s1431927620016499

journal article·2020-08Open access

Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry

Menglin Zhu, Jinwoo Hwang

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

Menglin Zhu, Jinwoo Hwang; Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry, Microscopy and Microanalysis, Volume

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Thermal properties of materials · Force Microscopy Techniques and Applications · nanoparticles nucleation surface interactions

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References (5)

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