Towards Artifact-free FIB-SEM Datasets: Strategies Before, During, and After Image Acquisition
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Abstract
Kedar Narayan, Alexandre Laquerre, Michael Phaneuf; Towards Artifact-free FIB-SEM Datasets: Strategies Before, During, and After Image Acquisition, Microsc
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (4)
Show source-provided references
1. 10.1038/nmeth.362310.1038/nmeth.3623 ↗
2. 10.1016/j.jsb.2013.11.00810.1016/j.jsb.2013.11.008 ↗
3. 4. Phaneuf, M. W. and Lagarec, K. G. (2017). Microscopy imaging method and system US9812290B2 filed 31 Jan 2017 & issued 07 Nov 2017.
4. Enhanced FIB-SEM systems for large-volume 3D imaging