Sparse and Adaptive Sampling in Scanning Electron Microscopy
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Abstract
Tim Dahmen, Patrick Trampert; Sparse and Adaptive Sampling in Scanning Electron Microscopy, Microscopy and Microanalysis, Volume 25, Issue S1, 1 February 2
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (4)
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1. 10.1038/srep2535010.1038/srep25350 ↗
2. 10.1017/S143192761700143X10.1017/S143192761700143X ↗
3. 10.1016/j.ultramic.2018.03.00710.1016/j.ultramic.2018.03.007 ↗
4. The authors thank Thermo Fischer Scientific, DFKI GmbH, Saarland University, and INM GmbH for funding the research.