Applications of High Precision STEM Imaging to Structurally Complex Materials
Source abstract
Abstract
Jie Feng, Chenyu Zhang, Dan Zhou, Zhongnan Xu, Dane Morgan, Paul M Voyles; Applications of High Precision STEM Imaging to Structurally Complex Materials, M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
Show source-provided references
1. 10.1016/j.ultramic.2013.12.00410.1016/j.ultramic.2013.12.004 ↗
2. High precision STEM method development and imaging of vacancies was supported by the U.S. Department of Energy (DE-FG02-08ER46547). Reverse structure determination was supported by the U.S. National Science Foundation (DMR-1332851).
3. 10.1016/j.ultramic.2015.12.00210.1016/j.ultramic.2015.12.002 ↗
4. 10.1021/acsnano.5b0572210.1021/acsnano.5b05722 ↗
5. 10.1038/ncomms515510.1038/ncomms5155 ↗