Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method
Source abstract
Abstract
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin; Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Volta
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1017/S143192760909242310.1017/S1431927609092423 ↗
2. 10.1017/S143192761009401810.1017/S1431927610094018 ↗
3. 10.1111/j.1365-2818.1975.tb03895.x10.1111/j.1365-2818.1975.tb03895.x ↗
4. 10.1111/j.1365-2818.2006.01549.x10.1111/j.1365-2818.2006.01549.x ↗