DataVXMicroscopy and MicroanalysisPaper
journal article·2013-08Open access

Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode

T.J. Prosa, D. Olson, A.D. Giddings, W. Lefebvre, P.H. Clifton, D.J. Larson

Microscopy and Microanalysis· Volume 19· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques

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