journal article·2015-08Open access

Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy

C.B. Prater, M. Lo, Q. Hu, H. Yang, C. Marcott, K. Kjoller

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

CB Prater, M Lo, Q Hu, H Yang, C Marcott, K Kjoller; Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy, Microscopy and Microanalysis, Volume 21, I
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications

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References (5)

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5. Phase-Resolved Surface Plasmon Interferometry of Graphene. Phys. Rev. Lett · 2014 · 113 · 055502