DataVXMicroscopy and MicroanalysisPaper
journal article·2024-07-24

Instrument Optimization of a High-Energy Electron Energy-loss Spectrometry System in an Aberration-Corrected Scanning Transmission Electron Microscope

Masashi Watanabe, Alexander Campos-Quiros, Giulio Guzzinati, Pirmin Kükelhan, Volker Gerheim, Martin Linck, Heiko Müller, Max Haider, Thomas F Hoffman, Kotaro Sakaguchi, Masaki Mukai, Thomas Isabell, Naoki Shimura, Hidetaka Sawada

Microscopy and Microanalysis· Volume 30· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques

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Affiliations

Department of Materials Science and Engineering, Lehigh University , Bethlehem, PA , United States

Institute for Materials Research, Tohoku University , Sendai, Miyagi , Japan

CEOS GmbH , Heidelberg , Germany

JEOL USA , Peabody, MA , United States

JEOL Germany GmbH , Freising , Germany

JEOL Ltd , Akishima, Tokyo , Japan

References (3)

Show source-provided references
1. Kahl
2. Craven · Ultramicrosc · 2017 · 18010.1016/j.ultramic.2017.03.017 ↗
3. McCaffrey · Microsc. Res. Tech · 1995 · 3210.1002/jemt.1070320507 ↗