journal article·2024-07-24Open access

Characterization and Customization of Individual EDS Detectors to Improve X-ray Microanalysis of Light Elements

Philippe T Pinard, Simon Burgess, John Qing Zhang, Peter J Statham

Microscopy and Microanalysis· Volume 30· Issue Supplement_1

Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advancements in Photolithography Techniques

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Affiliations

Oxford Instruments NanoAnalysis , High Wycombe , UK

References (8)

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