In Situ AFM-SEM-EDS, a Correlative Microscopy Platform for Surface Characterization and Elemental Analysis
Bibliographic record
Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Force Microscopy Techniques and Applications
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Affiliations
Quantum Design Inc. , San Diego, CA , United States
Quantum Design Microscopy GmbH , Pfungstadt , Germany
References (13)
Show source-provided references
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10. Arat · Microscopy and Microanalysis · 2019 · 25 · 90310.1017/S143192761900062X ↗
11. Burgess · Microscopy and Analysis · 2013 · 6 · S8
12. Newbury · Journal of Materials Science · 2015 · 50 · 49310.1007/s10853-014-8685-2 ↗
13. Newbury · Scanning Microscopies · 2014 · 9236 · 9236OH10.1117/12.2065842 ↗