Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra
Source abstract
Abstract
Dale E Newbury, Nicholas W M Ritchie; Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spec
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Particle Detector Development and Performance · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
National Institute of Standards and Technology , Gaithersburg, MD, USA
References (3)
Show source-provided references
1. Ritchie · Microscopy and Microanalysis · 2010 · 16 · 24810.1017/S1431927610000243 ↗
2. Ritchie
3. Zaluzec · Microscopy and Microanalysis · 2009 · 15 · 9310.1017/S1431927609090217 ↗