Focused Ne⁺ Beam for Improved SIMS Analysis of Lithium Ion Batteries

Journal Article Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries Get access Fouzia Khanom, Fouzia Khanom Carl Zeiss SMT, Inc. PCS Integration Center, One Corporation Way, Peabody, MA, USA Corresponding author: fouzia.khanom@zeiss.com Search for other works by this author on: Oxford Academic Google Scholar U Golla-Schindler, U Golla-Schindler Materials Research Institute (IMFAA), Aalen University, Aalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Timo Bernthaler, Timo Bernthaler Materials Research Institute (IMFAA), Aalen University, Aalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Gerhard Schneider, Gerhard Schneider Materials Research Institute (IMFAA), Aalen University, Aalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Brett Lewis Brett Lewis Carl Zeiss SMT, Inc. PCS Integration Center, One Corporation Way, Peabody, MA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 866–867, https://doi.org/10.1017/S1431927619005063 Published: 01 August 2019