High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
Source abstract
Abstract
Hao Yang, Lewys Jones, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Timothy J Pennycook, Peter D Nellist; Hig
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S003358350000305X10.1017/S003358350000305X ↗
2. 10.1016/0304-3991(93)90105-710.1016/0304-3991(93)90105-7 ↗