A Xe + Plasma FIB Milling and Lift-out Approach for Site-specific Preparation of Large Volume Blocks for 3D-EBSD

B. Winiarski; T.L. Burnett; P.J. Withers

doi:10.1017/s1431927616005031

journal article·2016-07Open access

A Xe + Plasma FIB Milling and Lift-out Approach for Site-specific Preparation of Large Volume Blocks for 3D-EBSD

B. Winiarski, T.L. Burnett, P.J. Withers

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

B Winiarski, TL Burnett, PJ Withers; A Xe + Plasma FIB Milling and Lift-out Approach for Site-specific Preparation of Large Volume Blocks for 3D-EBSD, Micr

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Materials Characterization Techniques · Integrated Circuits and Semiconductor Failure Analysis · Advanced Surface Polishing Techniques

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References (4)

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3. Corrosion Reviews · 2015 · 33 · 44310.1515/corrrev-2015-0050 ↗

4. Acta Materialia · 2013 · 13 · 4726