High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide
Source abstract
Abstract
Li He, Yizhang Zhai, Cheng Liu, Chao Jiang, Izabela Szlufarska, Beata Tyburska-Puschel, Kumar Sridharan, Paul Voyles; High-Resolution Scanning Transmission
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis · Thin-Film Transistor Technologies
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References
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