Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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Affiliations

Bruker AXS (formerly Nion R&D) , Kirkland, WA , USA

Dept. of Mechanical Engineering and Materials Science, Yale University , New Haven, CT , USA

Institute of Scientific Instruments of Czech Academy of Sciences , Brno , Czech Republic

Department of Physics, Arizona State U. , Tempe, AZ , USA

References (6)