Latest Developments in Post-FIB Concentrated Ar Ion Beam Milling of TEM Specimens with Large Electron-transparent Areas

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques

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Affiliations

E.A. Fischione Instruments, Inc. , Export, PA , USA

References (5)