Nanoscale orientation mapping made easy: a new sample preparation workflow for rapid, large-area TKD analysis
Source abstract
Abstract
Pat Trimby, Iain Anderson, John Lindsay, Ali Gholinia, Timothy Burnett, Philip Withers; Nanoscale orientation mapping made easy: a new sample preparation w
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
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2. Keller · J. Microscopy · 2012 · 245 · 24510.1111/j.1365-2818.2011.03566.x ↗
3. Sneddon · Materials Science and Engineering R: Reports · 2016 · 110 · 110.1016/j.mser.2016.10.001 ↗
4. Echlin · Current Opinion in Solid State and Materials Science · 2020 · 24 · 10081710.1016/j.cossms.2020.100817 ↗
5. O'Shea · Micron · 2014 · 66 · 910.1016/j.micron.2014.04.011 ↗