Advanced Analytical Capabilities on FIB Instruments Using SIMS
Source abstract
Abstract
Tom Wirtz, Olivier De Castro, Antje Biesemeier, Hung Quang Hoang, Jean-Nicolas Audinot; Advanced Analytical Capabilities on FIB Instruments Using SIMS, Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Cultural Heritage Materials Analysis · Laser-induced spectroscopy and plasma
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References (6)
Show source-provided references
1. 10.1088/0957-4484/26/43/43400110.1088/0957-4484/26/43/434001 ↗
2. 10.1146/annurev-anchem-061318-11545710.1146/annurev-anchem-061318-115457 ↗
3. [4] Wirtz, T. , Dowsett, D. , Philipp, P. , Helium Ion Microscopy, ed. by Hlawacek, G. , Gölzhäuser, A. , Springer, 2017
4. [6] This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964.
5. 10.1021/acs.analchem.7b0125610.1021/acs.analchem.7b01256 ↗
6. 10.1021/acs.analchem.7b0148110.1021/acs.analchem.7b01481 ↗