Defect Imaging and Structure Evolution in GST Films During In-situ Heating

Chanchal Ghosh; Manish Singh; John Watt; Helena Silva; C Barry Carter

doi:10.1017/s1431927620017961

journal article·2020-08Open access

Defect Imaging and Structure Evolution in GST Films During In-situ Heating

Chanchal Ghosh, Manish Singh, John Watt, Helena Silva, C Barry Carter

Microscopy and Microanalysis· Volume 26· Issue S2

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Chanchal Ghosh, Manish Singh, John Watt, Helena Silva, C Barry Carter; Defect Imaging and Structure Evolution in GST Films During In-situ Heating, Microsco

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OpenAlex topics: Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films · Integrated Circuits and Semiconductor Failure Analysis

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