Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total
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Abstract
Dale E Newbury, Nicholas W M Ritchie; Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total, Microscopy and Microanalysis, Volume 25, Is
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
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References (3)
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1. 10.1007/978-1-4939-6676-910.1007/978-1-4939-6676-9 ↗
2. Ritchie N.W.M. (2018). NIST DTSA-II software, including tutorials. Available for free at: www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html (retrieved November 27, 2018).
3. Castaing R. , Ph. D. Thesis, “Application of electron probes to local chemical and crystallographic analysis,” University of Paris (1951).