Automated Real-time Analysis of Atomic-resolution STEM Images

Understanding the microstructural characteristics of materials, such as lattice defects, increasingly relies on the analysis of large numbers of images from electron and scanning probe microscopy It is now becoming routine to record series of atomic-resolution images, resulting in the generation of massive datasets. The new challenge is then analysing this data. The workflow for such analyses typically comprises the identification of atomic positions and subsequent derivation of physical quantities, such as defect concentration and strain. Conventionally, this analysis is done manually, which is slow and laborious, and the results are prone to human errors and bias.